Ioannis (Yiannis) Sarridis

Deep Learning Researcher @ MeVer and PhD student @ DIT/HUA.

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I received both my bachelor’s and master’s degrees from the Department of Informatics at Aristotle University of Thessaloniki, Thessaloniki, Greece, in 2018 and 2020, respectively. I am currently pursuing a Ph.D. degree at Harokopio University of Athens and working as a Research Associate with the Centre for Research and Technology Hellas, Thessaloniki, Greece. My research interests include AI fairness, face recognition, AI at the edge, computer vision, and deep learning. To date, I have authored 18 publications, including 9 first-author conference papers and 2 first-author journal articles, with two of the first-authored works published in top-tier venues, i.e., IEEE International Conference on Computer Vision (ICCV) and IEEE Transactions on Pattern Analysis and Machine Intelligence (TPAMI).

news

Sep 09, 2025 Three papers on bias assessment and mitigation in visual data has been accepted for publication.
  • MAVias: Mitigate any Visual Bias, ICCV 2025 (link)
  • BAdd: Bias Mitigation through Bias Addition, ICCV 2025 Workshops, (link)
  • VB-Mitigator: An Open-source Framework for Evaluating and Advancing Visual Bias Mitigation, ECAI 2025 Workshops (link)
Nov 05, 2024 The first journal paper related to my PhD research was published in the IEEE Transactions on Pattern Analysis and Machine Intelligence.
  • I. Sarridis, C. Koutlis, S. Papadopoulos and C. Diou, “FLAC: Fairness-Aware Representation Learning by Suppressing Attribute-Class Associations” in IEEE Transactions on Pattern Analysis & Machine Intelligence, doi: 10.1109/TPAMI.2024.3487254.
  • Paper: link
  • Code: link

selected publications

  1. C
    MAVias: Mitigate Any Visual Bias
    Ioannis Sarridis, Christos Koutlis, Symeon Papadopoulos, and Christos Diou
    In Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV), 2025
  2. J
    FLAC: Fairness-Aware Representation Learning by Suppressing Attribute-Class Associations
    Ioannis Sarridis, Christos Koutlis, Symeon Papadopoulos, and Christos Diou
    IEEE Transactions on Pattern Analysis and Machine Intelligence, 2024